Adriano Di Cristoforo

AREE TEMATICHE DI RIFERIMENTO:

• Microscopia Elettronica a Scansione e in Trasmissione (Philips XL20, Zeiss Supra 40, Tescan Vega3, Philips CM200);
• Analisi EDS
• Preparazione campioni per la microscopia SEM e TEM;
• Diffrazione a raggi X (Bruker D8).

THEMATIC AREAS OF REFERENCE:

• SEM and TEM microscopy (Philips XL20, Zeiss Supra 40, Tescan Vega3, Philips CM200)
• Energy Dispersive X-Ray Spectroscopy (EDS)
• SEM and TEM sample preparation for Materials Science;
• X-Ray diffraction (Bruker D8).

Laboratory: ADVANCED  X-RAY  DIFFRACTION  LABORATORY – Thematic Sector: NANOSTRUCTURE OF SOLID MATERIALS
Laboratory: MICROSCOPIA ELETTRONICA – Thematic Sector: MICROSCOPIA ELETTRONICA A SCANSIONE
Laboratory: MICROSCOPIA ELETTRONICA – Thematic Sector: Preparazione campioni per la Microscopia Elettronica